1. Ga‐focused ion beam time‐of‐flight secondary ion mass spectrometer analysis of the grain boundary segregation/precipitation of boron in steel. (14th February 2014) Authors: Tanaka, Tomohito; Fujishiro, Taishi; Shigesato, Genichi; Hayashi, Shun‐ichi Journal: Surface and interface analysis Issue: Volume 46:Number 5(2014) Page Start: 297 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗