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3. Micro‐Photoluminescence Imaging at Room Temperature of Crystallographic Defects Generated by Deep Trench Structures. Issue 17 (27th May 2022)

4. Modeling of phosphorus diffusion in silicon oxide and incorporation in silicon nanocrystals. Issue 16 (6th April 2016)

7. Thermodynamic stability of high phosphorus concentration in silicon nanostructures. Issue 34 (10th August 2015)