1. Digital cells radiation hardness study of TPSCo 65 nm CIS technology by designing a ring oscillator. (28th February 2023) Authors: Barbero, M.; Barrillon, P.; Fougeron, D.; Habib, A.; Pangaud, P. Journal: Journal of instrumentation Issue: Volume 18:Number 2(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. HV/HR-CMOS sensors for the ATLAS upgrade—concepts and test chip results. (20th March 2015) Authors: Liu, J.; Backhaus, M.; Barbero, M.; Bates, R.; Blue, A.; Bompard, F.; Breugnon, P.; Buttar, C.; Capeans, M.; Clemens, J.C.; Feigl, S.; Ferrere, D.; Fougeron, D.; Garcia-Sciveres, M.; George, M.; Godiot-Basolo, S.; Gonella, L.; Gonzalez-Sevilla, S.; Große-Knetter, J.; Hemperek, T. Journal: Journal of instrumentation Issue: Volume 10:Number 3(2015:Mar.) Page Start: C03033 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Single event effects on the RD53B pixel chip digital logic and on-chip CDR. (6th May 2022) Authors: Lalic, J.; Fougeron, D.; Madsen, E.; Joly, E.R.A.; Christiansen, J.; Flores Sanz De Acedo, L.; Menouni, M.; Standke, M.; Barrillon, P.; Rymaszewski, P.; Strebler, T. Journal: Journal of instrumentation Issue: Volume 17:Number 5(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗