1. A Quantitative Method for In-Situ Pump-Beam Metrology in Ultrafast Electron Microscopy. (August 2021) Authors: Chen, Jialiang; Leighton, Chris; Flannigan, David Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 3416 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Femtosecond TEM: Imaging Nanoscale Materials Dynamics at Temporal Extremes. (August 2020) Authors: Flannigan, David; Gnabasik, Ryan; Zhang, Yichao Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1126 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Pulsed Electron Beams for Mitigating Damage in Next-generation Electronic Materials. (August 2020) Authors: VandenBussche, Elisah; Clark, Catherine; Holmes, Russell; Flannigan, David Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2866 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage. (August 2020) Authors: Flannigan, David; VandenBussche, Elisah Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2066 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Quantifying Transient Strain and Energy of Coherent Acoustic Phonons with UEM Imaging. (August 2020) Authors: Du, Daniel; Cremons, Daniel; Flannigan, David Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 212 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Single-Electron Temporal Behavior in the Gun Region of the Tecnai Femto UEM. (August 2021) Authors: Curtis, Wyatt; Flannigan, David Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 3420 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Strain Patterning via Spontaneous Centroidal Voronoi Tessellation in Few-Layer MoS2. (August 2020) Authors: Zhang, Yichao; Flannigan, David Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2368 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Using UEM to Probe Buried Structures in Real Space: An Analog to Phonon Spectroscopy. (August 2020) Authors: VandenBussche, Elisah; Flannigan, David Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 216 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗