1. A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation. (19th June 2017) Authors: Fischione, Paul E.; Williams, Robert E.A.; Genç, Arda; Fraser, Hamish L.; Dunin-Borkowski, Rafal E.; Luysberg, Martina; Bonifacio, Cecile S.; Kovács, András Journal: Microscopy and microanalysis Issue: Volume 23:Number 4(2017) Page Start: 782 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗