1. Advantages of Helium and Neon Ion Beams for Intelligent Imaging. (August 2014) Authors: Wu, Huimeng; Mcvey, Shawn; Ferranti, David; Huynh, Chuong; Notte, John; Stern, Lewis; Joens, Matthew S.; Fitzpatrick, James A. J; Goetze, Bernhard Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 338 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Advantages of Helium and Neon Ion Beams for Intelligent Imaging. (August 2014) Authors: Wu, Huimeng; Mcvey, Shawn; Ferranti, David; Huynh, Chuong; Notte, John; Stern, Lewis; Joens, Matthew S.; Fitzpatrick, James A. J; Goetze, Bernhard Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 338 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS). (23rd September 2015) Authors: Xia, Deying; Wu, Huimeng; Geotze, Bernhard; Ferranti, David; Stern, Lewis; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1165 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS). (August 2015) Authors: Xia, Deying; Wu, Huimeng; Geotze, Bernhard; Ferranti, David; Stern, Lewis; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1165 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗