Author/Creator: Fer, M. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Fer, M.

1. On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology. (September 2016)

Authors:: Viale, B.; Fer, M.; Courau, L.; Galy, P.; Allard, B.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 101
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology. (September 2016)

Authors:: Viale, B.; Fer, M.; Courau, L.; Galy, P.; Allard, B.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 101
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗