1. In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB. (August 2021) Authors: Schwalb, Chistian; Hütner, Johanna; Frerichs, Hajo; Wolff, Marion; Winkler, Robert; Andany, Santiago; Hosemann, Peter; Hlawacek, Gregor; Fantner, Georg; Plank, Harald Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1020 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. In-situ Correlative Analysis of Electrical and Mechanical Properties of 3D Nanostructures by Combination of AFM, SEM and FIB. (August 2020) Authors: Schwalb, Christian; Frank, Pinar; Hummel, Stefan; Sattelkov, Juergen; Winkler, Robert; Huetner, Johanna; Domanov, Oleg; Fantner, Georg; Plank, Harald Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1800 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Modeling and Design of high-speed FM-AFM driver electronics using Cadence Virtuoso® and Simulink®. Issue 1 (2015) Authors: Schlecker, Benedikt; Eichel, Anna; Ortmanns, Maurits; Fantner, Georg; Anders, Jens Journal: IFAC-PapersOnLine Issue: Volume 48:Issue 1(2015) Page Start: 671 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗