1. Defect localization in high-power vertical cavity surface emitting laser arrays by means of reverse biased emission microscopy. (9th June 2021) Authors: Fabbro, Robert; Haber, Thomas; Fasching, Gernot; Coppeta, Raffaele; Pusterhofer, Michael; Grogger, Werner Journal: Measurement science & technology Issue: Volume 32:Number 9(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Electrical-stress driven oxidation in 940 nm oxide-confined VCSEL. (10th December 2021) Authors: Pusterhofer, Michael; Fabbro, Robert; Coppeta, Raffaele A; Fasching, Gernot; Hadley, Peter Journal: Semiconductor science and technology Issue: Volume 37:Number 1(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. In-situ observation of lateral AlAs oxidation and dislocation formation in VCSELs. (July 2022) Authors: Fabbro, Robert; Coppeta, Raffaele; Pusterhofer, Michael; Fasching, Gernot; Haber, Thomas; Grogger, Werner Journal: Micron Issue: Volume 158(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗