1. A compact model and direct parameters extraction techniques For amorphous gallium-indium-zinc-oxide thin film transistors. (December 2016) Authors: Moldovan, Oana; Castro-Carranza, Alejandra; Cerdeira, Antonio; Estrada, Magali; Barquinha, Pedro; Martins, Rodrigo; Fortunato, Elvira; Miljakovic, Slobodan; Iñiguez, Benjamin Journal: Solid-state electronics Issue: Volume 126(2016) Page Start: 81 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A compact model and direct parameters extraction techniques For amorphous gallium-indium-zinc-oxide thin film transistors. (December 2016) Authors: Moldovan, Oana; Castro-Carranza, Alejandra; Cerdeira, Antonio; Estrada, Magali; Barquinha, Pedro; Martins, Rodrigo; Fortunato, Elvira; Miljakovic, Slobodan; Iñiguez, Benjamin Journal: Solid-state electronics Issue: Volume 126(2016) Page Start: 81 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Compact modeling of triple gate junctionless MOSFETs for accurate circuit design in a wide temperature range. (September 2019) Authors: Pavanello, Marcelo Antonio; Cerdeira, Antonio; Doria, Rodrigo Trevisoli; Ribeiro, Thales Augusto; Ávila-Herrera, Fernando; Estrada, Magali Journal: Solid-state electronics Issue: Volume 159(2019) Page Start: 116 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Comparative degradation analysis of V2O5, MoO3 and their stacks as hole transport layers in high-efficiency inverted polymer solar cells. Issue 20 (7th May 2021) Authors: Sacramento, Angel; Ramírez-Como, Magaly; Balderrama, Victor S.; Sánchez, José G.; Pallarès, Josep; Marsal, Lluis F.; Estrada, Magali Journal: Journal of materials chemistry Issue: Volume 9:Issue 20(2021) Page Start: 6518 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Gate leakage currents model for FinFETs implemented in Verilog‐A for electronic circuits design. (7th March 2014) Authors: Garduño, Salvador I.; Alvarado, Joaquín; Cerdeira, Antonio; Estrada, Magali; Kilchytska, Valeriya; Flandre, Denis; Crupi, Giovanni; Schreurs, Dominique; Caddemi, Alina Journal: International journal of numerical modelling Issue: Volume 27:Number 5/6(2014) Page Start: 846 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. High-efficiency organic solar cells based on a halide salt and polyfluorene polymer with a high alignment-level of the cathode selective contact. Issue 45 (18th September 2018) Authors: Balderrama, Victor S.; Sánchez, José G.; Lastra, Gonzalo; Cambarau, Werther; Arias, Saúl; Pallarès, Josep; Palomares, Emilio; Estrada, Magali; Marsal, Lluis F. Journal: Journal of materials chemistry Issue: Volume 6:Issue 45(2018) Page Start: 22534 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Impact of inkjet printed ZnO electron transport layer on the characteristics of polymer solar cells. Issue 24 (9th April 2018) Authors: Sánchez, José G.; Balderrama, Víctor S.; Garduño, Salvador I.; Osorio, Edith; Viterisi, Aurelien; Estrada, Magali; Ferré-Borrull, Josep; Pallarès, Josep; Marsal, Lluis F. Journal: RSC advances Issue: Volume 8:Issue 24(2018) Page Start: 13094 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. On the series resistance in staggered amorphous thin film transistors. (August 2016) Authors: Cerdeira, Antonio; Estrada, Magali; Marsal, Lluis F.; Pallares, Josep; Iñiguez, Benjamín Journal: Microelectronics and reliability Issue: Volume 63(2016) Page Start: 325 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. On the series resistance in staggered amorphous thin film transistors. (August 2016) Authors: Cerdeira, Antonio; Estrada, Magali; Marsal, Lluis F.; Pallares, Josep; Iñiguez, Benjamín Journal: Microelectronics and reliability Issue: Volume 63(2016) Page Start: 325 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗