1. Origins of residual stress in thin films: Interaction between microstructure and growth kinetics. (15th November 2016) Authors: Engwall, A.M.; Rao, Z.; Chason, E. Journal: Materials & design Issue: Volume 110(2016) Page Start: 616 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Origins of residual stress in thin films: Interaction between microstructure and growth kinetics. (15th November 2016) Authors: Engwall, A.M.; Rao, Z.; Chason, E. Journal: Materials & design Issue: Volume 110(2016) Page Start: 616 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Stress evolution during growth of 1-D island arrays: Kinetics and length scaling. (1st March 2015) Authors: Chason, E.; Engwall, A.M.; Miller, C.M.; Chen, C.-H.; Bhandari, A.; Soni, S.K.; Hearne, S.J.; Freund, L.B.; Sheldon, B.W. Journal: Scripta materialia Issue: Volume 97(2015) Page Start: 33 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Stress evolution during growth of 1-D island arrays: Kinetics and length scaling. (1st March 2015) Authors: Chason, E.; Engwall, A.M.; Miller, C.M.; Chen, C.-H.; Bhandari, A.; Soni, S.K.; Hearne, S.J.; Freund, L.B.; Sheldon, B.W. Journal: Scripta materialia Issue: Volume 97(2015) Page Start: 33 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗