1. Accelerated Electromigration Study of Cobalt Thin Films by In-Situ TEM. (August 2019) Authors: Engler, Brent; Hull, Robert Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 1902 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Liquid Cell TEM of Al Thin Film Corrosion under Potentiostatic Polarization. (23rd September 2015) Authors: Wee Chee, See; Park, Jeung-Hun; Pinkowitz, Ainsley; Engler, Brent; Ross, Frances M.; Duquette, David; Hull, Robert Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 973 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Liquid Cell TEM of Al Thin Film Corrosion under Potentiostatic Polarization. (August 2015) Authors: Wee Chee, See; Park, Jeung-Hun; Pinkowitz, Ainsley; Engler, Brent; Ross, Frances M.; Duquette, David; Hull, Robert Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 973 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗