1. Impact of source doping profile on the performance of CNT TFETs and MOSFETs: design aspects for fabrication tolerance. (11th June 2021) Authors: Salah, Ahmed; Shaker, Ahmed; El-Banna, Mohamed; Ossaimee, Mahmoud Journal: Semiconductor science and technology Issue: Volume 36:Number 7(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗