1. Atomic Electron Tomography: Past, Present and Future. (August 2020) Authors: Miao, Jianwei; Tian, Xuezeng; Kim, Dennis; Zhou, Jihan; Yang, Yongsoo; Yang, Yao; Yuan, Yakun; Ophus, Colin; Schmid, Andreas; Yang, Shize; Sun, Fan; Ciccarino, Christopher; Duschatko, Blake; Idrobo, Juan-Carlos; Narang, Prineha; Zeng, Hao; Ercius, Peter Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 652 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Determining the 3D Atomic Coordinates and Crystal Defects in 2D Materials with Picometer Precision. (August 2019) Authors: Tian, Xuezeng; Kim, Dennis S.; Yang, Shize; Ciccarino, Christopher J.; Gong, Yongji; Yang, Yongsoo; Yang, Yao; Duschatko, Blake; Yuan, Yakun; Ajayan, Pulickel M.; Idrobo, Juan-Carlos; Narang, Prineha; Miao, Jianwei Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 404 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗