1. Characterization and Optimization of OSTEM; A Novel Detection Method for Single- and Multi-Beam Scanning Electron Microscopy. (August 2022) Authors: Kievits, Arent; Fermie, Job; Duinkerken, Peter; Lane, Ryan; Carroll, Elizabeth; Giepmans, Ben; Hoogenboom, Jacob Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 1458 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗