1. Possible Approaches for Combined Use of Xenon and Gallium Ion Sources for Task Specific Focused Ion Beam Sample Preparation. (August 2022) Authors: Klimša, Ladislav; Duchoň, Jan; Svora, Petr; Kopeček, Jaromír Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 26 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Radiation-induced phase separation in nanostructured Hf-In-C ternary thin films under irradiation with 200 keV Ar+ ion beam. Issue 1 (1st February 2022) Authors: Vacik, Jiri; Cannavò, Antonino; Bakardjieva, Snejana; Kupcik, Jaroslav; Lavrentiev, Vasily; Ceccio, Giovanni; Horak, Pavel; Nemecek, Jiri; Verna, Alessio; Parmeggiani, Matteo; Calcagno, Lucia; Klie, Robert; Duchoň, Jan Journal: Radiation effects and defects in solids Issue: Volume 177:Issue 1/2(2022) Page Start: 137 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗