Author/Creator: Driussi, Francesco - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Driussi, Francesco

1. A study of metal-MoS2 contacts by using an in-house developed ab-initio transport simulator. (August 2022)

Authors:: Lizzit, Daniel; Khakbaz, Pedram; Driussi, Francesco; Pala, Marco; Esseni, David
Journal:: Solid-state electronics
Issue:: Volume 194(2022)
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Record Type:: Journal Article
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2. Dependable Contact Related Parameter Extraction in Graphene–Metal Junctions. (6th September 2020)

Authors:: Gahoi, Amit; Kataria, Satender; Driussi, Francesco; Venica, Stefano; Pandey, Himadri; Esseni, David; Selmi, Luca; Lemme, Max C.
Journal:: Advanced Electronic Materials
Issue:: Volume 6:Number 10(2020)
Page Start:: n/a
Record Type:: Journal Article
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3. Editorial: Letters from the 8th Joint International EUROSOI workshop and International Conference on Ultimate Integration on Silicon. (August 2022)

Authors:: Driussi, Francesco; Esseni, David; Lizzit, Daniel; Palestri, Pierpaolo
Journal:: Solid-state electronics
Issue:: Volume 194(2022)
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Record Type:: Journal Article
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4. Editorial: Selected papers from the 8th Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2022). (March 2023)

Authors:: Driussi, Francesco; Esseni, David; Lizzit, Daniel; Palestri, Pierpaolo
Journal:: Solid-state electronics
Issue:: Volume 201(2023)
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Record Type:: Journal Article
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5. Impact of bias conditions on electrical stress and ionizing radiation effects in Si-based TFETs. (January 2016)

Authors:: Ding, Lili; Gnani, Elena; Gerardin, Simone; Bagatin, Marta; Driussi, Francesco; Selmi, Luca; Royer, Cyrille Le; Paccagnella, Alessandro
Journal:: Solid-state electronics
Issue:: Volume 115 Part B(2016)
Page Start:: 146
Record Type:: Journal Article
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6. Novel experimental methodologies to reconcile large- and small-signal responses of Hafnium-based Ferroelectric Tunnel Junctions. (February 2023)

Authors:: Massarotto, Marco; Driussi, Francesco; Affanni, Antonio; Lancaster, Suzanne; Slesazeck, Stefan; Mikolajick, Thomas; Esseni, David
Journal:: Solid-state electronics
Issue:: Volume 200(2023)
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Record Type:: Journal Article
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