1. Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip. (October 2019) Authors: Chen, Zhe; Luo, Jiawei; Doudevski, Ivo; Erten, Sema; Kim, Seong H. Journal: Microscopy and microanalysis Issue: Volume 25:Number 5(2019) Page Start: 1106 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗