Author/Creator: Dorrer, C. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Dorrer, C.

1. MTW-OPAL: a technology development platform for ultra-intense optical parametric chirped-pulse amplification systems. (6th October 2021)

Authors:: Bromage, J.; Bahk, S.-W.; Bedzyk, M.; Begishev, I. A.; Bucht, S.; Dorrer, C.; Feng, C.; Jeon, C.; Mileham, C.; Roides, R. G.; Shaughnessy, K.; Shoup, M. J.; Spilatro, M.; Webb, B.; Weiner, D.; Zuegel, J. D.
Journal:: High power laser science and engineering
Issue:: Volume 9(2021)
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Record Type:: Journal Article
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2. Technology development for ultraintense all-OPCPA systems. (2019)

Authors:: Bromage, J.; Bahk, S.-W.; Begishev, I. A.; Dorrer, C.; Guardalben, M. J.; Hoffman, B. N.; Oliver, J. B.; Roides, R. G.; Schiesser, E. M.; Shoup III, M. J.; Spilatro, M.; Webb, B.; Weiner, D.; Zuegel, J. D.
Journal:: High power laser science and engineering
Issue:: Volume 7(2019)
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Record Type:: Journal Article
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3. Technology development for ultraintense all-OPCPA systems. (8th February 2019)

Authors:: Bromage, J.; Bahk, S.-W.; Begishev, I. A.; Dorrer, C.; Guardalben, M. J.; Hoffman, B. N.; Oliver, J. B.; Roides, R. G.; Schiesser, E. M.; Shoup, M. J.; Spilatro, M.; Webb, B.; Weiner, D.; Zuegel, J. D.
Journal:: High power laser science and engineering
Issue:: Volume 7(2019)
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Record Type:: Journal Article
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4. Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light. (May 2016)

Authors:: Rutkauskas, M.; Farrell, C.; Dorrer, C.; Marshall, K.L.; Crawford, T.; Lundquist, T.R.; Vedagarbha, P.; Erington, K.; Bodoh, D.; Reid, D.T.
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 62
Record Type:: Journal Article
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5. Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light. (May 2016)

Authors:: Rutkauskas, M.; Farrell, C.; Dorrer, C.; Marshall, K.L.; Crawford, T.; Lundquist, T.R.; Vedagarbha, P.; Erington, K.; Bodoh, D.; Reid, D.T.
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 62
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗