1. Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy. (7th February 2012) Authors: Dehlinger, M.; Dorczynski, C.; Fauquet, C.; Jandard, F.; Tonneau, D.; Bjeoumikhov, A.; Bjeoumikhova, S.; Gubzhokov, R.; Erko, A.; Zizak, I.; Pailharey, D.; Ferrero, S.; Dahmani, B. Journal: International journal of nanotechnology Issue: Volume 9:Number 3/4/5/6/7(2012) Page Start: 460 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗