1. Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High‐Resolution X‐Ray Diffraction: Theoretical and Practical Aspects (Small Methods 2/2022). Issue 2 (17th February 2022) Authors: Dolabella, Simone; Borzì, Aurelio; Dommann, Alex; Neels, Antonia Journal: Small methods Issue: Volume 6:Issue 2(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High‐Resolution X‐Ray Diffraction: Theoretical and Practical Aspects. Issue 2 (23rd December 2021) Authors: Dolabella, Simone; Borzì, Aurelio; Dommann, Alex; Neels, Antonia Journal: Small methods Issue: Volume 6:Issue 2(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗