1. In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures. (August 2014) Authors: Niehuis, Ewald; Moellers, Rudolf; Kollmer, Felix; Arlinghaus, Henrik; Bernard, Laetita; Josef Hug, Hans; Vranjkovic, Sasa; Dianoux, Raphaelle; Scheidemann, Adi Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 2086 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures. (August 2014) Authors: Niehuis, Ewald; Moellers, Rudolf; Kollmer, Felix; Arlinghaus, Henrik; Bernard, Laetita; Josef Hug, Hans; Vranjkovic, Sasa; Dianoux, Raphaelle; Scheidemann, Adi Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 2086 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions. (23rd September 2015) Authors: Dianoux, Raphaelle; Scheidemann, Adi; Niehuis, Ewald; Mollers, Rudolf; Kollmer, Felix; Arlinghaus, Henrik; Hug, Hans-Josef; Bernard, Laetitia; Vranjkovic, Sasa Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1431 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions. (August 2015) Authors: Dianoux, Raphaelle; Scheidemann, Adi; Niehuis, Ewald; Mollers, Rudolf; Kollmer, Felix; Arlinghaus, Henrik; Hug, Hans-Josef; Bernard, Laetitia; Vranjkovic, Sasa Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1431 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗