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Author/Creator Dherbecourt, Pascal

1. A novel methodology to characterize LGA packaged GaN power transistors using a mother/daughter board configuration for the reliability qualification in the mild hybrid applications. (November 2022)

Authors:
Douzi, Chawki; Kadi, Moncef; Dherbecourt, Pascal; Besserour, Mohamed Akram; Joubert, Eric; Fouquet, François
Journal:
Microelectronics and reliability
Issue:
Volume 138(2022)
Page Start:
Record Type:
Journal Article
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