1. Fractal characterizations of energetic Si ions irradiated amorphized‐Si surfaces. (22nd May 2019) Authors: Maity, G.; Ojha, Sunil; Sulania, I.; Devrani, K.; Patel, Shiv P. Journal: Surface and interface analysis Issue: Volume 51:Number 8(2019) Page Start: 817 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗