1. Development of a cryogenic indentation tool with in situ optical observation, application to the mechanical characterization of II–VI semiconductors. (18th February 2021) Authors: Broult, T; Kerlain, A; Destefanis, V; Guinedor, P; Bourhis, E Le; Patriarche, G Journal: Semiconductor science and technology Issue: Volume 36:Number 3(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. DLTS study of extended defects in HgCdTe photodiodes. (May 2019) Authors: Guinedor, P; Broult, T; Brunner, A; Rubaldo, L; Bauza, D; Reimbold, G; Kerlain, A; Destefanis, V Journal: Journal of physics Issue: Volume 1190(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗