1. Career Path Under the Lens: From Technician to Technical Specialist. (August 2020) Authors: Derr, KD Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1890 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. MSA Focused Interest Groups: Atom Probe Field Ion Microscopy and Focused Ion Beam Microscopy. (July 2022) Authors: Jungjohann, Katherine; Perea, Daniel; Sugar, Josh; Diercks, David; Derr, KD; Devaraj, Arun Journal: Microscopy today Issue: Volume 30:Number 4(2022) Page Start: 42 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗