Author/Creator: Della Marca, V. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Della Marca, V.

1. AC stress reliability study on a novel vertical MOS transistor for non-volatile memory technology. (November 2020)

Authors:: Locati, J.; Della Marca, V.; Rivero, C.; Fornara, P.; Regnier, A.; Niel, S.; Coulié, K.
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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2. Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction. (September 2018)

Authors:: Della Marca, V.; Postel-Pellerin, J.; Kempf, T.; Regnier, A.; Chiquet, P.; Bocquet, M.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 159
Record Type:: Journal Article
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