1. A multi-energy level agnostic approach for defect generation during TDDB stress. (July 2022) Authors: Vici, Andrea; Degraeve, Robin; Kaczer, Ben; Franco, Jacopo; Van Beek, Simon; De Wolf, Ingrid Journal: Solid-state electronics Issue: Volume 193(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A multi-energy level agnostic simulation approach to defect generation. (October 2021) Authors: Vici, Andrea; Degraeve, Robin; Kaczer, Ben; Franco, Jacopo; Van Beek, Simon; De Wolf, Ingrid Journal: Solid-state electronics Issue: Volume 184(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. RRAMs based on anionic and cationic switching: a short overview. Issue 6 (4th April 2014) Authors: Clima, Sergiu; Sankaran, Kiroubanand; Chen, Yang Yin; Fantini, Andrea; Celano, Umberto; Belmonte, Attilio; Zhang, Leqi; Goux, Ludovic; Govoreanu, Bogdan; Degraeve, Robin; Wouters, Dirk J.; Jurczak, Malgorzata; Vandervorst, Wilfried; Gendt, Stefan De; Pourtois, Geoffrey Journal: Physica status solidi Issue: Volume 8:Issue 6(2014:Jun.) Page Start: 501 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗