1. A method based on the Levenshtein distance metric for the comparison of multiple movement patterns described by matrix sequences of different length. (January 2019) Authors: Beernaerts, Jasper; Debever, Ellen; Lenoir, Matthieu; De Baets, Bernard; Van de Weghe, Nico Journal: Expert systems with applications Issue: Volume 115(2019) Page Start: 373 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗