1. Buried SiGe as a performance booster in n-channel FDSOI MOSFETs. (December 2019) Authors: Clifton, Paul; Goebel, Andreas; Mulfinger, Robert; Child, Amy; Straub, Sherry; Sporer, Ryan; Carter, Rick; Kluth, Jon; Schaeffer, Jamie; Nguyen, Bich-Yen; Chabanne, Guillaume; Daval, Nicolas; Schwarzenbach, Walter; Hemkar, Manish; Chu, Schubert; Moffatt, Steve Journal: Solid-state electronics Issue: Volume 162(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗