1. An in situ atomic force microscope for normal‐incidence nanofocus X‐ray experiments. (10th August 2016) Authors: Vitorino, M. V.; Fuchs, Y.; Dane, T.; Rodrigues, M. S.; Rosenthal, M.; Panzarella, A.; Bernard, P.; Hignette, O.; Dupuy, L.; Burghammer, M.; Costa, L. Journal: Journal of synchrotron radiation Issue: Volume 23:Part 5(2016) Page Start: 1110 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Local scale structural changes of working OFET devices. Issue 4 (20th November 2019) Authors: Grodd, L. S.; Mikayelyan, E.; Dane, T.; Pietsch, U.; Grigorian, S. Journal: Nanoscale Issue: Volume 12:Issue 4(2020) Page Start: 2434 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗