1. (Invited) Oxygen in Silicon: End of the Story?. (23rd July 2018) Authors: Kissinger, Gudrun; Kot, Dawid; Schubert, Markus Andreas; Dabrowski, Jaroslaw; Sattler, Andreas; Mueller, Timo Journal: ECS transactions Issue: Volume 86:Number 10(2018) Page Start: 61 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. About the influence of deposited nitride layers on oxide precipitation after RTA pre‐treatment. Issue 7 (26th May 2017) Authors: Kissinger, Gudrun; Kot, Dawid; Dabrowski, Jaroslaw; Grabolla, Thomas; Müller, Timo; Sattler, Andreas Journal: Physica status solidi Issue: Volume 214:Issue 7(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Experimental and Theoretical Investigation of the Surface Electronic Structure of ZnGa2O4(100) Single‐Crystals. Issue 3 (23rd December 2021) Authors: Reichmann, Felix; Dabrowski, Jaroslaw; Becker, Andreas Paul; Klesse, Wolfgang Matthias; Irmscher, Klaus; Schewski, Robert; Galazka, Zbigniew; Mulazzi, Mattia Journal: Physica status solidi Issue: Volume 259:Issue 3(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. VOn Complexes in RTA Treated Czochralski Silicon Wafers Investigated by FTIR Spectroscopy. (23rd July 2018) Authors: Kot, Dawid; Kissinger, Gudrun; Dabrowski, Jaroslaw; Sattler, Andreas Journal: ECS transactions Issue: Volume 86:Number 10(2018) Page Start: 95 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗