Author/Creator: Croes, K. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Croes, K.

11. Endocrine activity in an urban river system and the biodegradation of estrogen-like endocrine disrupting chemicals through a bio-analytical approach using DRE- and ERE-CALUX bioassays. (June 2018)

Authors:: Vandermarken, T.; Croes, K.; Van Langenhove, K.; Boonen, I.; Servais, P.; Garcia-Armisen, T.; Brion, N.; Denison, M.S.; Goeyens, L.; Elskens, M.
Journal:: Chemosphere
Issue:: Volume 201(2018)
Page Start:: 540
Record Type:: Journal Article
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12. Erratum: Current Understanding of BEOL TDDB Lifetime Models [ECS J. Solid State Sci. Technol., 4, N3094 (2015)]. (1st January 2015)

Authors:: Croes, K.; Wu, C.; Kocaay, D.; Li, Y.; Roussel, Ph.; Bömmels, J.; Tőkei, Zs.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 4:Number 5(2015)
Page Start:: X6
Record Type:: Journal Article
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13. Erratum: Current Understanding of BEOL TDDB Lifetime Models [ECS J. Solid State Sci. Technol., 4, N3094 (2015)]. (5th March 2015)

Authors:: Croes, K.; Wu, C.; Kocaay, D.; Li, Y.; Roussel, Ph.; Bömmels, J.; Tőkei, Zs.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 4:Number 5(2015)
Page Start:: X6
Record Type:: Journal Article
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14. LER and spacing variability on BEOL TDDB using E-field mapping: Impact of field acceleration. (September 2017)

Authors:: Kocaay, D.; Roussel, Ph.J.; Croes, K.; Ciofi, I.; Saad, Y.; De Wolf, I.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 131
Record Type:: Journal Article
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15. Lock-in thermal laser stimulation for non-destructive failure localization in 3-D devices. (September 2017)

Authors:: Jacobs, K.J.P.; Wang, T.; Stucchi, M.; Gonzalez, M.; Croes, K.; De Wolf, I.; Beyne, E.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 188
Record Type:: Journal Article
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16. Non-invasive soft breakdown localisation in low k dielectrics using photon emission microscopy and thermal laser stimulation. (January 2019)

Authors:: Herfurth, N.; Wu, C.; Beyreuther, A.; Nakamura, T.; De Wolf, I.; Simon-Najasek, M.; Altmann, F.; Croes, K.; Boit, C.
Journal:: Microelectronics and reliability
Issue:: Volume 92(2019)
Page Start:: 73
Record Type:: Journal Article
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17. Review—Modeling Methods for Analysis of Electromigration Degradation in Nano-Interconnects. (4th March 2021)

Authors:: Ceric, H.; Selberherr, S.; Zahedmanesh, H.; de Orio, R. L.; Croes, K.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 10:Number 3(2021)
Page Start:
Record Type:: Journal Article
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