1. Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources. (26th April 2019) Authors: Shard, Alexander G.; Counsell, Jonathan D.P.; Cant, David J. H.; Smith, Emily F.; Navabpour, Parnia; Zhang, Xiaoling; Blomfield, Christopher J. Journal: Surface and interface analysis Issue: Volume 51:Number 7(2019) Page Start: 763 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗