1. Extraction of dynamic avalanche during IGBT turn off. (September 2017) Authors: Geissmann, Silvan; Michielis, L. De; Corvasce, Ch.; Rahimo, M.; Andenna, M. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 495 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗