1. Reciprocal space mapping and strain scanning using X‐ray diffraction microscopy. Issue 5 (13th September 2018) Authors: Poulsen, H. F.; Cook, P. K.; Leemreize, H.; Pedersen, A. F.; Yildirim, C.; Kutsal, M.; Jakobsen, A. C.; Trujillo, J. X.; Ormstrup, J.; Detlefs, C. Journal: Journal of applied crystallography Issue: Volume 51:Issue 5(2018) Page Start: 1428 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗