1. Single‐shot full strain tensor determination with microbeam X‐ray Laue diffraction and a two‐dimensional energy‐dispersive detector. Issue 3 (30th May 2017) Authors: Abboud, A.; Kirchlechner, C.; Keckes, J.; Conka Nurdan, T.; Send, S.; Micha, J. S.; Ulrich, O.; Hartmann, R.; Strüder, L.; Pietsch, U. Journal: Journal of applied crystallography Issue: Volume 50:Issue 3(2017) Page Start: 901 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗