1. Electromigration-induced resistance switching in indented Al microstrips. (12th November 2019) Authors: Lombardo, J; Collienne, S; Petrillo, A; Fourneau, E; Nguyen, N D; Silhanek, A V Journal: New journal of physics Issue: Volume 21:Number 11(2019:Nov.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗