Author/Creator: Coignus, Jean - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Coignus, Jean

1. (Invited) Resistive Memories (RRAM) Variability: Challenges and Solutions. (20th July 2018)

Authors:: Molas, Gabriel; Sassine, Gilbert; Nail, Cecile; Alfaro Robayo, Diego; Nodin, Jean-François; Cagli, Carlo; Coignus, Jean; Blaise, Philippe; Nowak, Etienne
Journal:: ECS transactions
Issue:: Volume 86:Number 3(2018)
Page Start:: 35
Record Type:: Journal Article
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2. Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory. (February 2017)

Authors:: Dobri, Adam; Jeannot, Simon; Piazza, Fausto; Jahan, Carine; Coignus, Jean; Perniola, Luca; Balestra, Francis
Journal:: Microelectronics and reliability
Issue:: Volume 69(2017)
Page Start:: 47
Record Type:: Journal Article
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3. Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology. (December 2017)

Authors:: Torrente, Giulio; Coignus, Jean; Vernhet, Alexandre; Ogier, Jean-Luc; Roy, David; Ghibaudo, Gérard
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 281
Record Type:: Journal Article
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4. Physically-based extraction methodology for accurate MOSFET degradation assessment. Issue 9 (August 2015)

Authors:: Torrente, Giulio; Coignus, Jean; Renard, Sophie; Vernhet, Alexandre; Reimbold, Gilles; Roy, David; Ghibaudo, Gerard
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1417
Record Type:: Journal Article
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