1. A comparative analysis of different measurement techniques to monitor metal and organic contamination in silicon device processing. Issue 3 (25th February 2015) Authors: Polignano, M. L.; Codegoni, D.; Grasso, S.; Mica, I.; Borionetti, G.; Nutsch, A. Journal: Physica status solidi Issue: Volume 212:Issue 3(2015:Mar.) Page Start: 495 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Nanoscale reinforcement of polypropylene composites with carbon nanotubes and clay: Dispersion state, electromagnetic and nanomechanical properties. Issue 3 (10th December 2015) Authors: Petrova, I.; Kotsilkova, R.; Ivanov, E.; Kuzhir, P.; Bychanok, D.; Kouravelou, K.; Karachalios, Th.; Soto Beobide, A.; Voyiatzis, G.; Codegoni, D.; Somaini, F.; Zanotti, L. Journal: Polymer engineering & science Issue: Volume 56:Issue 3(2016:Mar.) Page Start: 269 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Palladium contamination in silicon. (April 2015) Authors: Polignano, M.L.; Mica, I.; Ceresoli, M.; Codegoni, D.; Somaini, F.; Bianchi, I.; Volonghi, D. Journal: Solid-state electronics Issue: Volume 106(2015) Page Start: 68 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Review—Characterization of Metal-Contamination Effects in Silicon. (10th December 2015) Authors: Polignano, M. L.; Codegoni, D.; Galbiati, A.; Grasso, S.; Mica, I.; Moccia, G.; Nardone, G.; Russo, F. Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3048 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗