Author/Creator: Chuang, K.F. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Chuang, K.F.

1. Failure and stress analysis of through-aluminum-nitride-via substrates during thermal reliability tests for high power LED applications. (December 2016)

Authors:: Tsai, M.Y.; Lin, C.H.; Chuang, K.F.; Chang, Y.H.; Wu, C.T.; Hu, S.C.
Journal:: Microelectronics and reliability
Issue:: Volume 67(2016)
Page Start:: 120
Record Type:: Journal Article
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