1. Characterization of GaAs:Cr sensors using the charge-integrating JUNGFRAU readout chip. (21st May 2019) Authors: Greiffenberg, D.; Andrä, M.; Barten, R.; Bergamaschi, A.; Busca, P.; Brückner, M.; Alvarez, S. Chiriotti; Chsherbakov, I.; Dinapoli, R.; Fajardo, P.; Fröjdh, E.; Lopez-Cuenca, C.; Lozinskaya, A.; Meyer, M.; Mezza, D.; Mozzanica, A.; Redford, S.; Ruat, M.; Ruder, C.; Schmitt, B. Journal: Journal of instrumentation Issue: Volume 14:Number 5(2019) Page Start: P05020 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. GaAs:Cr X-ray sensors noise characteristics investigation by means of amplitude spectrum analysis. (24th January 2018) Authors: Chsherbakov, I.; Kolesnikova, I.; Lozinskaya, A.; Mihaylov, T.; Novikov, V.; Shemeryankina, A.; Tolbanov, O.; Tyazhev, A.; Zarubin, A. Journal: Journal of instrumentation Issue: Volume 13:Number 1(2018:Jan.) Page Start: C01030 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. High-spatial resolution measurements with a GaAs:Cr sensor using the charge integrating MÖNCH detector with a pixel pitch of 25 μm. (1st April 2022) Authors: Chiriotti, S.; Barten, R.; Bergamaschi, A.; Brückner, M.; Carulla, M.; Chsherbakov, I.; Dinapoli, R.; Fröjdh, E.; Greiffenberg, D.; Hasanaj, S.; Hinger, V.; King, T.; Kozlowski, P.; Lopez-Cuenca, C.; Lozinskaya, A.; Marone, F.; Mezza, D.; Moustakas, K.; Mozzanica, A.; Ruder, C. Journal: Journal of instrumentation Issue: Volume 17:Number 4(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗