1. Multilayer Thin Films as Pseudo-Homogeneous EDX Standards. (23rd September 2015) Authors: Colijn, Hendrik O.; Orsborn, Jonathan; Chmielewski, Daniel; McComb, David W. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1641 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Multilayer Thin Films as Pseudo-Homogeneous EDX Standards. (August 2015) Authors: Colijn, Hendrik O.; Orsborn, Jonathan; Chmielewski, Daniel; McComb, David W. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1641 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗