1. High sensitivity X-ray analysis for a low accelerating voltage scanning electron microscope using a transition edge sensor. (26th May 2020) Authors: Tanaka, Keiichi; Takano, Akira; Nagata, Atsushi; Nakayama, Satoshi; Takahashi, Kaname; Ajima, Masahiko; Obara, Kenji; Chinone, Kazuo Journal: Microscopy Issue: Volume 69:Number 5(2020) Page Start: 298 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗