1. Determination of the London penetration depth of FeSe0.3Te0.7 thin films by scanning SQUID microscope. (1st July 2015) Authors: Lin, H T; Wu, S L; Wang, J W; Chen, T J; Wang, M J; Chen, J C; Wu, M K; Chi, C C Journal: Superconductor science & technology Issue: Volume 28:Number 8(2015:Aug.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗