Author/Creator: Chen, T.N. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Chen, T.N.

1. Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment. (February 2016)

Authors:: Wang, X.Y.; Zhang, H.; Ma, X.P.; Cheng, Q.; Li, C.G.; Li, M.X.; Chen, T.N.; Zhang, P.; Shao, J.Q.
Journal:: Microelectronics and reliability
Issue:: Volume 57(2016)
Page Start:: 79
Record Type:: Journal Article
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2. Improvement of reliability for high-ohmic Cr–Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water. (May 2016)

Authors:: Wang, X.Y.; Cheng, Q.; Ma, X.P.; Zhang, H.; Li, M.X.; Chen, T.N.; Zhang, P.; Shao, J.Q.
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 101
Record Type:: Journal Article
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3. Improvement of reliability for high-ohmic Cr–Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water. (May 2016)

Authors:: Wang, X.Y.; Cheng, Q.; Ma, X.P.; Zhang, H.; Li, M.X.; Chen, T.N.; Zhang, P.; Shao, J.Q.
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 101
Record Type:: Journal Article
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4. Mechanism on M (MNi, Mo, NiMo) as deep level impurity reducing the TCR of Si-rich CrSi resistive films. (September 2017)

Authors:: Wang, X.Y.; Liu, Y.P.; Ding, B.N.; Li, M.X.; Chen, T.N.; Zhu, X.T.
Journal:: Superlattices and microstructures
Issue:: Volume 109(2017)
Page Start:: 217
Record Type:: Journal Article
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