1. Applied Photoelasticity for Residual Stress Measurement inside Crystal Silicon Wafers for Solar Applications. (23rd May 2016) Authors: Jagailloux, F.; Valle, V.; Dupré, J.‐C.; Penot, J.‐D.; Chabli, A. Other Names: Huntley J. M. guestEditor.; Groves R. M. guestEditor.; Bhattacharya N. guestEditor. Journal: Strain Issue: Volume 52:Number 4(2016:Aug.) Page Start: 355 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗