Author/Creator: Ceric, H. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Ceric, H.

1. Analysis of electromigration failure of nano-interconnects through a combination of modeling and experimental methods. (September 2019)

Authors:: Ceric, H.; Zahedmanesh, H.; Croes, K.
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
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2. Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs. Issue 9 (August 2015)

Authors:: Sharma, P.; Tyaginov, S.; Wimmer, Y.; Rudolf, F.; Rupp, K.; Enichlmair, H.; Park, J.-M.; Ceric, H.; Grasser, T.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1427
Record Type:: Journal Article
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3. Electrostatic Coupling and Identification of Single-Defects in GaN/AlGaN Fin-MIS-HEMTs. (June 2019)

Authors:: Grill, A.; Stampfer, B.; Im, Ki-Sik; Lee, J.-H.; Ostermaier, C.; Ceric, H.; Waltl, M.; Grasser, T.
Journal:: Solid-state electronics
Issue:: Volume 156(2019)
Page Start:: 41
Record Type:: Journal Article
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4. Microstructural impact on electromigration reliability of gold interconnects. (February 2023)

Authors:: Ceric, H.; de Orio, R.L.; Selberherr, S.
Journal:: Solid-state electronics
Issue:: Volume 200(2023)
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Record Type:: Journal Article
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5. Review—Modeling Methods for Analysis of Electromigration Degradation in Nano-Interconnects. (4th March 2021)

Authors:: Ceric, H.; Selberherr, S.; Zahedmanesh, H.; de Orio, R. L.; Croes, K.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 10:Number 3(2021)
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Record Type:: Journal Article
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