Search

Search Constraints

You searched for: Author/Creator Catthoor, F.

Search Results

1. A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. (February 2018)

5. The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits. (November 2016)

6. The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits. (November 2016)