1. (Invited)Extending Advanced CMOS Scaling with SiGe Channel Materials. (9th April 2018) Authors: Carter, Rick J; Sporer, Ryan; McArdle, Timothy J; Mulfinger, George Robert; Holt, Judson Robert; Beasor, Scott; Child, Amy; Fronheiser, Jody; Wahl, Jeremy A; Geisler, Holm; Kluth, George J; Triyoso, Dina H; Punchihewa, Kasun; Rana, Uzma; Vanamurthy, Laks; Sohn, D K Journal: ECS transactions Issue: Volume 85:Number 6(2018) Page Start: 3 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗